Skip to content
2000
Volume 1, Issue 2
  • ISSN: 1872-2105
  • E-ISSN: 2212-4020

Abstract

Nanoclusters (NC) as charge storage nodes have been applied in nonvolatile, high-speed, high-density and low-power memory devices. Compared with conventional floating gate memory, where a layer of poly-Si is used for charge storage, a memory device composed of nanoclusters isolated by dielectrics benefits from a relatively low operating voltage, high endurance, fast write-erase speeds and better immunity to soft errors due to the quantum confinement and Coulomb blockade effects. Recent patents in this field have proposed several innovated structures and fabrication methods for nanocluster based floating gate flash memory and single-electron memory devices.

Loading

Article metrics loading...

/content/journals/nanotec/10.2174/187221007780859636
2007-06-01
2026-02-25
Loading full text...

Full text loading...

/content/journals/nanotec/10.2174/187221007780859636
Loading
This is a required field
Please enter a valid email address
Approval was a Success
Invalid data
An Error Occurred
Approval was partially successful, following selected items could not be processed due to error
Please enter a valid_number test