Environmental Stress-Induced Degradation in Thin-Film Transistors
- Authors: Meng Zhang1, Mingxiang Wang2
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View Affiliations Hide Affiliations1 College of Electronics and Information Engineering, Shenzhen University, Shenzhen, China 2 Department of Microelectronics, Soochow University, Suzhou 215006, China
- Source: Thin-Film Transistor Reliability , pp 250-280
- Publication Date: April 2025
- Language: English
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This chapter explores the impact of environmental factors on the reliability of thin-film transistors (TFTs), discussing the effects of temperature, illumination, and moisture on the performance and degradation of TFTs. It provides a comprehensive analysis of how these environmental conditions can influence the overall reliability and stability of electronic devices incorporating TFTs.
Hardbound ISBN:
9789815322620
Ebook ISBN:
9789815322613
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