Circuit-Level Stress-Induced Degradation in Thin-Film Transistors
- Authors: Meng Zhang1, Mingxiang Wang2
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View Affiliations Hide Affiliations1 College of Electronics and Information Engineering, Shenzhen University, Shenzhen, China 2 Department of Microelectronics, Soochow University Suzhou 215006, China
- Source: Thin-Film Transistor Reliability , pp 201-249
- Publication Date: April 2025
- Language: English
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This chapter discusses the degradation of Thin-Film Transistors (TFTs) under circuit-level stress, which is crucial for understanding their performance and reliability in practical applications. It covers AC degradation under DC bias, bipolar AC degradation, and ultra-fast AC degradation, providing insights into the impact of different stress conditions on the TFTs' performance and reliability.
Hardbound ISBN:
9789815322620
Ebook ISBN:
9789815322613
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