Reliability Analysis Methods for Thin-Film Transistors
- Authors: Meng Zhang1, Mingxiang Wang2
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View Affiliations Hide Affiliations1 College of Electronics and Information Engineering, Shenzhen University, Shenzhen, China 2 Department of Microelectronics, Soochow University, Suzhou 215006, China
- Source: Thin-Film Transistor Reliability , pp 76-128
- Publication Date: April 2025
- Language: English
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This chapter explores the various methods used for reliability analysis of Thin-Film Transistors (TFTs). It covers transfer curve degradation analysis techniques, capacitance-voltage curve analysis, low-frequency noise analysis, and thin-film quality assessment. Additionally, the chapter discusses simulation analysis methods, including TCAD simulation and thermal simulation, which are crucial for evaluating and enhancing the reliability of TFTs in electronic applications.
Hardbound ISBN:
9789815322620
Ebook ISBN:
9789815322613
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