Overview of Reliability Issues in Thin-Film Transistors
- Authors: Meng Zhang1, Mingxiang Wang2
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View Affiliations Hide Affiliations1 College of Electronics and Information Engineering, Shenzhen University, Shenzhen, China 2 Department of Microelectronics, Soochow University, Suzhou 215006, China
- Source: Thin-Film Transistor Reliability , pp 43-75
- Publication Date: April 2025
- Language: English
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This chapter provides an in-depth analysis of the reliability issues associated with thin-film transistors (TFTs), focusing on the common defects found in silicon-based and metal-oxide TFTs. It discusses the various types of defect states and the typical degradation mechanisms that impact the performance of TFTs. The chapter emphasizes the need for comprehensive understanding and strategies to mitigate these reliability challenges in TFT applications.
Hardbound ISBN:
9789815322620
Ebook ISBN:
9789815322613
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/content/books/9789815322613.chapter-2dcterms_subject,pub_keyword-contentType:Journal -contentType:Figure -contentType:Table -contentType:SupplementaryData105
/content/books/9789815322613.chapter-2
dcterms_subject,pub_keyword
-contentType:Journal -contentType:Figure -contentType:Table -contentType:SupplementaryData
10
5
Chapter
content/books/9789815322613
Book
false
en
