Modified Gamma Network: Design and Reliability Evaluation

Background: VLSI technology advancements have resulted the requirements of high computational power, which can be achieved by implementing multiple processors in parallel. These multiple processors have to communicate with their memory modules by using Interconnection Networks (IN). Multistage Interconnection Networks (MIN) are used as IN, as they provide efficient computing with low cost. Objective: The objective of the study is to introduce new reliable Gamma MIN named as a Modified Gamma Interconnection Network (MGIN), which provide reliability and fault-tolerance with less number of stages of Switching element only. Methods: Switching Element (SE) of bigger size i.e. 2×3/3×2 has been employed at input/output stages inspite of 1×3/3×1 sized SE at input/output stages with reduction in one intermidiate stage. Fault tolerance has been introduced in the form of disjoint paths formed between each sourcedestnation node pair. Hence reliability has been improved. Results: Terminal, Broadcast and Network Reliability has been evaluated by using Reliability Block Diagrams for each source-destination node pair. The results have been shown, which depicts the higher reliability values for newly proposed network. The cost analysis shows that new MGIN is a cheaper network than other Gamma variants. Conclusion: MGIN has better reliability and Fault-tolerance than priviously proposed Gamma MIN.