Dual-Energy CT (DECT): A New Technique for Artifact Reduction from Metallic Orthopedic Implants

Computed tomography (CT) plays an important role in the postoperative evaluation after metallic orthopedic implant placements for investigating complications (for example, implant fracture, faults, loosening and infections). Despite advances in CT technology, artefacts from metal implants can seriously impair CT image quality and diagnostic capabilities. In this article, basic principles of dual-energy CT (DECT) and its ability to reduce metal artefact are reviewed. Advantages and drawbacks of DECT in reducing metal artefacts in comparison with other single-energy CT approaches are also discussed. Although further systematic studies are needed to create optimized and standardized protocols, DECT with its monoenergetic reconstructions has to be considered a technique that opens new and effective possibilities for metallic artefact reduction in CT examinations.