Focused Ion Beam Methods and its Applications in Secondary Batteries
- Authors: Ni Yang1, Yali Li2, Lian Wang3, Tinglu Song4, Yuefeng Su5
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View Affiliations Hide Affiliations1 Chongqing Innovation Center, Beijing Institute of Technology, Chongqing 401151, China 2 Chongqing Innovation Center, Beijing Institute of Technology, Chongqing 401151, China 3 Chongqing Innovation Center, Beijing Institute of Technology, Chongqing 401151, China 4 Experimental Center of Advanced Materials, School of Materials Science and Engineering, Beijing Institute of Technology, Beijing 100081, China 5 Chongqing Innovation Center, Beijing Institute of Technology, Chongqing 401151, China
- Source: Advanced Characterization Technologies for Secondary Batteries , pp 37-74
- Publication Date: November 2024
- Language: English
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This chapter discusses the major challenges of characterizing the microstructure and morphology of battery materials, as well as the limitations of current characterization techniques in lithium-ion batteries. To address these challenges, the dual-beam system of focused ion beam scanning electron microscopy (FIB-SEM) emerges as one promising solution. The FIB-SEM system enables accurate manipulation and analysis of battery materials from both micro- and nano-scale perspectives, thus providing valuable insights for the development of high-performance and safe lithium-ion batteries.
Hardbound ISBN:
9789815305432
Ebook ISBN:
9789815305425
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