Transmission Electron Microscopy and its Applications in Secondary Batteries
- Authors: Lixia Bao1, Ruiwen Shao2, Tinglu Song3, Yong Yang4, Fan Xu5
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View Affiliations Hide Affiliations1 Analysis & Testing Center, Beijing Institute of Technology, Beijing 102488, China 2 Beijing Advanced Innovation Center for Intelligent Robots and Systems and Institute of Convergence in Medicine and Engineering, Beijing Institute of Technology, Beijing 100081, China 3 Experimental Center for Advanced Materials, School of Materials Science and Engineering, Beijing Institute of Technology, Beijing 100081, China 4 Shandong Meijiatu New Material Technology Co., Ltd., Jinan 250300, China 5 State Key Laboratory for Artificial Microstructure and Mesoscopic Physics, School of Physics, Frontiers Science Center for Nano optoelectronics & Collaborative Innovation Center of Quantum Matter, Peking University, Beijing 100871, China
- Source: Advanced Characterization Technologies for Secondary Batteries , pp 1-36
- Publication Date: November 2024
- Language: English
Transmission Electron Microscopy and its Applications in Secondary Batteries, Page 1 of 1
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Transmission electron microscopy (TEM) has been widely employed as an important technique for detecting morphology in various secondary battery applications. When integrated with diverse accessories, TEM could attain sub-angstrom level detection, cryogenic TEM (cryo-TEM), and other functionalities, which enables the observation and comprehension of the microstructure of secondary battery materials, as well as structural variations during battery charging and discharging processes. In this chapter, essential structures, main functions, and sample preparation methods of TEM are introduced. Additionally, applications of TEM in characterizing materials used in secondary batteries are discussed and summarized. The aim is to provide essential guidance for employing TEM and to facilitate its future development.
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