f Preface

Authors: Meng Zhang¹, Mingxiang Wang²
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¹ College of Electronics and Information Engineering, Shenzhen University, Shenzhen, China ² Department of Microelectronics, Soochow University, Suzhou 215006, China
Source: Thin-Film Transistor Reliability , pp ii-iii
Publication Date: April 2025
Language: English

Hardbound ISBN: 9789815322620

Ebook ISBN: 9789815322613

Book DOI: https://doi.org/10.2174/97898153226131250101

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