Pulse and Lock-In NDT Infrared Active-Source Techniques
- By Ralph A. Rotolante1
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View Affiliations Hide Affiliations1 Vicon Infrared 98 Baldwin Dr. C-8 Boxborough, MA 01719, USA
- Source: Infrared Thermography Recent Advances and Future Trends , pp 181-198
- Publication Date: July 2012
- Language: English
Pulse and Lock-In NDT Infrared Active-Source Techniques, Page 1 of 1
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Infrared Pulse and Lock-In techniques are in use for NDT applications worldwide for Defect Imaging, Stress Imaging, Solar-Cell Shunt Imaging, Solar-Cell Carrier-Density/Lifetime Imaging, and Semiconductor Photo-and Electro-Luminescence imaging. A variety of active-sources, various infrared camera types and a selection of analytical tools are available for monitoring the responses of the materials to the active-sources. This chapter presents an overview of this rich choice of NDT tools used in academia, laboratories and factories for studies of material types ranging from composites, metals, ceramics, polymers and concrete, to semiconductors, solar cells, bones, leather and cheese, and projects strong future growth for the technology.
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